Power

X-500 / X-55 Series Power Fail Protection
The X-500 and X-55 SSDs use an internal DRAM, but only management data is cached in the DRAM, no user...

IEEE 802.11be Technology Introduction
The IEEE 802.11 working group develops the wireless local area network (WLAN) specifications behind the...

eGaN® FET Drivers and Layout Considerations
When considering gate drive requirements, the three most important parameters for eGaN FETs are (1) the...

MTBF: misquoted and misunderstood
Reliability is one of the most important factors that a designer needs to consider when specifying components...

Addressing Thermal Challenges in High‐Density Power Applications
Demand for more features and higher performance from ever-smaller form factors presents significant challenges...

Black Hole Detection by BroadView™ Instrumentation Software
Describes the black hole phenomenon and how the BroadView Instrumentation Software Suite leverages Broadcom...

Ultra-Low Noise Figure, High Gain Amplifier with High Linearity
This White Paper describes different trade-offs, design options, and implementation of a sub 1 dB low...

Parallel & Series Operation
It is much lower cost and causes far fewer problems to use a single power converter correctly rated for...
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