Semiconductors

eGaN® FET Drivers and Layout Considerations
When considering gate drive requirements, the three most important parameters for eGaN FETs are (1) the...

Fundamentals of Building a Test System
Most organizations do not consider production test a top priority, but it is a necessity to prevent major...

Gallium Nitride (GaN) Technology Overview
For over three decades, power management efficiency and cost showed steady improvement as innovations...

Working With Optically-Isolated Relays
Learn how optically - isolated relays can improve the performance of data acquisition systems and industrial...

2:1 MIPI CSI-2 Bridge Soft IP
In some cases, mobile Application Processors (AP) may not have enough interfaces to support the number...

Dead-Time Optimization for Maximum Efficiency
In this white paper EPC continues our exploration of optimization issues and look at the impact of dead-time...

Basics of Dual Fractional-N Synthesizers/PLLs
Over the years, a number of methods have been proposed to realize fractional-N frequency synthesis that...

The Risk Assessment Process
When undertaking machine safety activities, it is always important to have a clearly structured process...

Tips & Tricks on Double Pulse Testing
In modern societies, a substantial amount of electrical energy is required for the operation of electronic...
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